
Test report - general data of Laconic LunchBox H-Amp as AMP mode
General results
Laconic LunchBox H-Amp
The table shows a most important technical characteristics of Laconic LunchBox H-Amp
Test conditions
- For record of test signals RAA was used ADC: E-MU 1616m
- During tests RAA software-hardware measuring complex was used galvanic isolated power transformer and was excluded the effect of ground loop in the spectra
Detailed measurements report of technical characteristics
Report content
- Frequency response
- Frequency response with loaded resistors
- Frequency response vs load dynamic type headphones | Variation in frequency response dependence of load dynamic type headphones
- Frequency response vs load balance armature headphone type (one driver) | Variation in frequency response vs load balance armature headphone type (one driver)
- Impedance
- Maximum level:
- voltage output level vs load of sine
- current output level vs load of sine
- power output level vs load of sine
- THD vs load vs output voltage
Graphics setting view
Table of measured characteristics
Table of measured characteristics
Graphics setting view
Table of measured characteristics
with resistive load
Graphics setting view
Table of measured characteristics
loaded dynamic headphone type
Graphics setting view
Table of measured characteristics
loaded dynamic headphone type
Frequency response of Laconic LunchBox H-Amp loaded type balance armature headphone type (one driver) as AMP mode
Graphics setting view
Table of measured characteristics
loaded type balanced armature
Deviation of frequency response of Laconic LunchBox H-Amp loaded type balance armature headphone type (one driver) as AMP mode
Graphics setting view
Table of measured characteristics
loaded type balanced armature
Table of measured characteristics
The device was tested for a long time, a method of constructing the graph and table were outdated and not suitable for direct comparison of values between different devices. The current data are the closest to "Before hard overload" as the maximum level before clipping. The latest version of the methodology uses to build on the characters of the spectra and divided into "Pure power @ class A", "Optimal power @ class AB", "Hard power @ B class" and "Before hard overload".
Now the original data to update the graph and table no. Require re-testing of the device. Re-test will be conducted only in the presence of the device in a test lab RAA.
Reports and testing methodology is gradually updated. We try to generate the report in such a way that it would have been a single kind of report for all devices, convenient for direct comparison.
We constantly introduce new tests and improving the options for displaying graphs and parameters. It introduces different changes in reports. Because reports are generated automatically, the updates do not take much time.
In the development and implementation of new tests, new reports are more complete. To update some charts and tables may require additional time to process the raw data separately for each device.
Some devices require re-testing.
(the values of the maximum current and voltage)
Table of measured characteristics
The device was tested for a long time, a method of constructing the graph and table were outdated and not suitable for direct comparison of values between different devices. The current data are the closest to "Before hard overload" as the maximum level before clipping. The latest version of the methodology uses to build on the characters of the spectra and divided into "Pure power @ class A", "Optimal power @ class AB", "Hard power @ B class" and "Before hard overload".
Now the original data to update the graph and table no. Require re-testing of the device. Re-test will be conducted only in the presence of the device in a test lab RAA.
Reports and testing methodology is gradually updated. We try to generate the report in such a way that it would have been a single kind of report for all devices, convenient for direct comparison.
We constantly introduce new tests and improving the options for displaying graphs and parameters. It introduces different changes in reports. Because reports are generated automatically, the updates do not take much time.
In the development and implementation of new tests, new reports are more complete. To update some charts and tables may require additional time to process the raw data separately for each device.
Some devices require re-testing.
(the values of the maximum current and voltage)
mA
mA
mA
Table of measured characteristics
The device was tested for a long time, a method of constructing the graph and table were outdated and not suitable for direct comparison of values between different devices. The current data are the closest to "Before hard overload" as the maximum level before clipping. The latest version of the methodology uses to build on the characters of the spectra and divided into "Pure power @ class A", "Optimal power @ class AB", "Hard power @ B class" and "Before hard overload".
Now the original data to update the graph and table no. Require re-testing of the device. Re-test will be conducted only in the presence of the device in a test lab RAA.
Reports and testing methodology is gradually updated. We try to generate the report in such a way that it would have been a single kind of report for all devices, convenient for direct comparison.
We constantly introduce new tests and improving the options for displaying graphs and parameters. It introduces different changes in reports. Because reports are generated automatically, the updates do not take much time.
In the development and implementation of new tests, new reports are more complete. To update some charts and tables may require additional time to process the raw data separately for each device.
Some devices require re-testing.
(the values of the maximum current and voltage)